High performance storage systems technology update and introduction to 12G physical layer validationJohn Calvin
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA uBGA SSD’s present unique test challengesuBGA based test conf
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdatePCIePCIe is multi-lane scalable–1 to 16 lanesPCIe (Gen3) each
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdatePCBPCIe Conn.PCIe/SATA Conn.PCBAccept only a x2 PCIe, or a x1 PCIe
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateDesktop Cables ConceptPCIe CableExisting SATA CablePCIe CablePCBPC
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateFundamentals of 12G SAS characterization14
Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update12+G Design Problem:1000mV, FFE, Crosstalk, Crosstalk, Crosstalk,
Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update12G Design Problem:FFE, DFE A non-recursive DFE can only compensa
Link Analysis in the context of SAS-12G SAS 12 (Passive Link) Tx Rx Compliance Points. (Source 11-416r3) SAS 12 (Active Link) Active Driver and Rec
Compliance Points Descriptions A TxRx connection is the complete simplex signal path between the transmitter circuit and the receiver circuit IT and
SDLA channel de-convolution and de-embedding Given a good set of channel S-Parameters, a clear model of SAS TC can be obtained for jitter and AC para
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateAgenda: High performance storage systems technology update and int
Another.. Better way? A brief treatise on the “PMC or SAS-3 Eye” Considered as a replacement for WDP Method: PMC (11-416r2 section X, 5.7.5.7.3)–
SAS-3 brings an advanced set of crosstalk models into the channel evaluation and simulation process. Tektronix Technology Innovation Forum Spring 2
SAS-3 Eye integrated into Scope’s MATLAB servicesTektronix Technology Innovation Forum Spring 201222
Tektronix Technology Innovation Forum Spring 2012Preliminary SAS-3 Tx PreC, PostC Requirements23 High performance Storage Update
Tektronix Technology Innovation Forum Spring 201224SPL-2 Transmitter Training (11-036r9)Transmission Training Information Unit (TTIU) SPL-2 introdu
Jitter Analysis AdvancesBUJ and relevance to multilane topologies25 Interconnect and board layout technology is advancing and the greatest area of fo
Tektronix Technology Innovation Forum Spring 201226SAS-3 (r00) Specs The Jitter and AC parametric measurements currently in the draft SAS-12G spec
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdatePreliminary SAS-3 JTF RequirementsReference T10/11-221r4 R027
Tektronix Technology Innovation Forum Spring 201228 Classification of Rj and BUJ requires deep analysis into the lower probability regions of the c
ComprehensiveJitter Mapping tools 29 Tektronix Technology Innovation Forum Spring 2012
Tektronix Technology Innovation Forum Spring 2012Storage Timelines and Solutions DevelopmentToday2008 2009 2010 2011Gen 3- Silicon Phase6G Integrati
Tektronix Technology Innovation Forum Spring 201230 DPOJET applies straight-line fits on the Q scale of the combined Rj and NPJ CDF. The extent to
Tektronix Technology Innovation Forum Spring 201231Pure RjRj + BUJ
Tektronix Technology Innovation Forum Spring 2012 32BUJ on a 110011 (New BUJ Model –vs- Legacy).
Tektronix Technology Innovation Forum Spring 201233BUJ on a JTPAT (New BUJ Model –vs- Legacy).
The Tektronix DSA7(33/25)04D Real Time Oscilloscope family offers the following interconnect specs. 2 Channel 100Gs/sec Sample rate at 33 GHz ana
SAS-3 Spec R00 BW RequirementsTektronix Technology Innovation Forum Spring 201235
Bandwidth ConsiderationsSAS PRBS11 12G NRZ Power Spectrum High performance Storage UpdateTektronix Technology Innovation Forum Spring 201236
Bandwidth ConsiderationsSignal Acquisition and bit rate harmonicsHigh performance Storage UpdateTektronix Technology Innovation Forum Spring 201237
Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update3838Receiver Testing made easyHow the Family Fits TogetherDevice U
Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update39Stressed Voltage Eye CalibrationStressed Pattern GeneratorAnalyz
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA 3.1/ UTD 1.4.3 Spec Revisions4
Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update40Stressed Voltage EyeStressed Pattern GenerationAnalyzerBERTScope
Tektronix Technology Innovation Forum Spring 201241Rx Results (BertScope)DATAT-MHz T-SJ SJ Bits Errors BER Status ThreshVX DelayPS2 0.1 4.52 6E+08 0
Tektronix Technology Innovation Forum Spring 201242Automated Tx Results (TekExpress full Auto)Test NameTest 5.2.1-TX SSC Modulation TypeTest 5.2.2-T
Waveform Distortion Penalty Waveform Distortion Penalty (WDP/TWDP): Is a measurement method deployed in the SAS-2 spec. It uses acquired data aga
SAS/SATA Interconnect SolutionsTektronix Technology Innovation Forum Spring 201244Tektronix and Wilder Technologies have collaborated and jointly en
Mini-SAS HD Plug Test Adapter (right-hand)Top ViewsHigh-PerformanceMini-SAS HD Plug Connector Configuration16 SMAs forHigh-Speed Testing8 Position Low
Tektronix Technology Innovation Forum Spring 2012 46
12G SAS Instrument Solution Strategy Phase 0 (Silicon Designers): Transition into Phase 1 in November 2011 – Equivalent Time Instrument: ICR, BER C
Integrated and Automated Test ControlTekExpress™ Test Automation FrameworkTekExpress Instrument Topology for TSG/PHY/OOB, RSG testing Complete offeri
Tektronix Technology Innovation Forum Spring 2012Complete Tektronix 12G Instrument PortfolioReceiver Tests/Active Cable TestsRSG/RMT- Receiver Sili
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateIt’s the measurements ..SATA UTD 1.4.3 Test RequirementsPhy Trans
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateEnabling Innovation in the Digital Age50
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA ECN 50: Asymmetric Amplitude and Measurement Methodology• Hos
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA ECN 50: Asymmetric Amplitude and Measurement Methodology (con
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateEmbeddedApplicationsSATA BGAToday, SATA is expanding in specialize
Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA uBGA SSD’s present unique test challengesNew SSD’s approved b
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